Elite Electronic Engineering Inc.
EMC and Environmental Stress Testing
Consulting, Certification, Program Management
1-800-Elite-11

IEEE EMC Society Chicago Chapter Meeting Held August 25th

Posted on: August 31st, 2010

 

 August 25, 2010

 Illinois Institute of Technology   Rice Campus Wheaton, IL

 Speaker: Daniel D. Hoolihan       President-Hoolihan EMC Consulting

 Radiated Emission Measurements at 1/3/5/10/30 Meters

 

Summary of Chicago EMCS Chapter Talk

There are two principal types of emission measurements in the world of Electromagnetic Compatibility, conducted emission and radiated emission. Radiated emission measurements are unique in that they must always state “the horizontal distance from the Equipment-Under-Test (EUT) to the receiving antenna.” This horizontal distance, which can be one, three, five, ten, or 30 meters, and the standardized limits associated with those distances are the subject of this presentation. Discussions of near-field physics are coupled with references to modeling of the phenomena plus references to many technical papers published relative to the subject over the last 35 years.

 

 

 Daniel Hoollihan

Biography of Daniel David Hoolihan –(M’ – 1983, SM’ – 1989)

 Daniel D. Hoolihan is currently President of Hoolihan EMC Consulting, 32515 Nottingham Court-Box 367, Lindstrom, Minnesota, 55045. His formal education includes a Bachelors Degree in Physics from Saint John’s University (Minnesota), a Masters Degree in Physics from Louisiana State University (Baton Rouge), and a Masters in Business Administration from the University of Minnesota (Minneapolis).

 Hoolihan has been consulting in EMC Engineering since January of 2000. He specializes in EMC-Laboratory evaluations, EMC standards, and EMC Education. He is a consultant to the United States Department of Commerce National Institute of Standards and Technology (NIST) in the area of Telecom Certification Body (TCB) and Conformity Assessment Body (CAB) evaluations. He also assists on the NIST National Voluntary Conformity Assessment Systems Evaluation (NVCASE) Program. He is also an assessor for the NIST National Voluntary Laboratory Accreditation Program (NVLAP) for both EMC/Telecom and Voting Systems.

  He worked TUV Product Service (TUV America) from 1994 to 2000. From 1984 to 1994, he was the Co-Founder and Chief Operating Officer of AMADOR Corporation. His first employment was with Control Data Corporation (1969 – 1984) in their internal EMC lab.

 He has been on the Board of Directors of the Electromagnetic Compatibility Society (EMCS) of the IEEE almost continuously since 1987. He is the past-president of the EMCS (1998-1999) and has held many positions with the EMCS Board. He served as the Chair of the 2002 IEEE International Symposium on EMC. He helped found the EMC chapter of the Twin Cities Section in 1985 and has been active in the local chapter since that time.

 He is presently the Vice-Chair of the ANSI-Accredited Standards Committee C63R on EMC

 

Location: 

Illinois Institute of Technology      Catered Dinner: 5:30 to 6:30 PM
Rice Campus Presentation            Time:                  6:30 to 9:00 PM
201 East Loop Road
Wheaton, Illinois 60189
630.682.6000

http://www.iit.edu/rice/about/directions.shtml

 

Internet Marketing & Web Design by Milwaukee Based Top Floor Technologies